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USB2.0-Dual

Design Semiware into your application circuit

Summary Application Circuit Diagram Documents Other

Summary

The ESD Protection solution for dual USB 2.0 interfaces aims to prevent damage to USB data and power lines caused by interference signals such as electrostatic discharge (ESD), electrical fast transients (EFT), and surges, thereby ensuring interface reliability and system stability.

Test Level: Contact-8kV Air-15kV

Application Circuit Diagram

Find products and reference designs suitable for your system

USB2.0-Dual

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